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        1 - Evaluation of resistant wheat genotypes of elite regional wheat yield trials 1397 to wheat leaf rust disease
        Seyed Taha Dadrezaei Mohammad Ali Dehghan Nosratallah Tabatabai Fard Hesamuddin Mofidi
        Wheat leaf rust, caused by Puccinia triticina Eriks, is one of the most important wheat diseases due to the extent of dispersion and damage in the world. This research project was conducted in order to evaluate reaction of 111 wheat genotypes of Elite Regional Wheat Yie More
        Wheat leaf rust, caused by Puccinia triticina Eriks, is one of the most important wheat diseases due to the extent of dispersion and damage in the world. This research project was conducted in order to evaluate reaction of 111 wheat genotypes of Elite Regional Wheat Yield Trials (ERWYT-97) to wheat rust disease under field conditions in Gorgan, Sari and Ahvaz. At the planting seasons, each genotype was planted in two meter rows in three replications for two years. In Karaj, resistance of genotypes was evaluated at seedling stage and under greenhouse conditions. In greenhouse, data were recorded 12 days after inoculation by McIntosh et al. method. The results showed that out of 111 advanced wheat lines, four climates had 25 acceptable resistance lines at three locations in two years. 86 lines were susceptible in one area or over two years. Also 7, 25, 7, 3, 7 line of 26 promising lines of South Zone wheat, the 25 promising lines of North Zone wheat, 20 promising lines of Cold Zone wheat 20 promising lines of Moderate Zone wheat, 20 promising line of salinity wheat respectively showed only one resistance line. Manuscript profile