In this paper we study the acquisition of fundamental TE mode reflection in rectangular cavities from a tilted face (end mirror) of superluminescent light emitting diodes (SLD). When its width is 3 micrometers and the inclination of the mirror is 3 ̊, the result will be More
In this paper we study the acquisition of fundamental TE mode reflection in rectangular cavities from a tilted face (end mirror) of superluminescent light emitting diodes (SLD). When its width is 3 micrometers and the inclination of the mirror is 3 ̊, the result will be a reduction of nearly 20 dB of reflection. While if the width is 6 micrometers, the inclination of the mirror 2 ̊ will cause an excess reflection loss of 20 dB. The results obtained in our paper for small tilt angles are the Gaussian approximation of the guided state. While our results differ greatly from the Gaussian approximation for larger angles and larger reflection losses.
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