Production and investigation about nano structures of heterogeneous ZnS/glass thin layer
محورهای موضوعی : مجله بین المللی ریاضیات صنعتی
H. Kangarlou
1
(Department of Mathematics, Urmia Branch, Islamic Azad University, Urmia, Iran.)
کلید واژه: AFM, XRD, nanostructure,
چکیده مقاله :
ZnS/glass Thinlayer in high vacuum condition and $40$ degree‎ ‎Deposition angle has been produced by resistance evaporated method ‎with $28$ nm thickness‎. ‎cabin deposition temperature ZnS layer was‎ ‎about $50C$ and substrates were kept at room temperature‎. ‎The Atomic ‎Force Microscopy (AFM) and XRD analyses are perfectly accomplished‎ ‎for this layer.‎‎‎
