Production and investigation about nano structures of heterogeneous ZnS/glass thin layer‎

محورهای موضوعی : مجله بین المللی ریاضیات صنعتی

H. Kangarlou ¹

1 - Department of Mathematics, Urmia Branch, Islamic Azad University, Urmia, Iran.

تاریخ دریافت : 1393/11/15 تاریخ پذیرش : 1393/11/15 تاریخ انتشار : 1393/10/11

کلید واژه: AFM, XRD, nanostructure‎‎‎,

چکیده مقاله :

ZnS/glass Thinlayer in high vacuum condition and $40$ degree‎ ‎Deposition angle has been produced by resistance evaporated method ‎with $28$ nm thickness‎. ‎cabin deposition temperature ZnS layer was‎ ‎about $50C$ and substrates were kept at room temperature‎. ‎The Atomic ‎Force Microscopy (AFM) and XRD analyses are perfectly accomplished‎ ‎for this layer.‎‎‎