Applicability of diffraction elastic constants to rationalize anisotropic broadening of X-ray diffraction line profiles from deformed metals

محورهای موضوعی : Journal of Theoretical and Applied Physics

Debtanu Ghosh ¹ , Sujay Munshi ² , Apurba Kanti Deb ³ , Partha Chatterjee ⁴

1 - Department of Physics Vivekananda Mahavidyalaya Haripal, Hooghly, West Bengal, India
2 - Department of Physics Raiganj University, Raiganj, Uttar Dinajpur – West Bengal, India
3 - Department of Physics Raiganj University, Raiganj, Uttar Dinajpur – West Bengal, India
4 - Department of Physics Vivekananda Mahavidyalaya Haripal, Hooghly, West Bengal, India

تاریخ دریافت : 1401/07/17 تاریخ پذیرش : 1401/09/10 تاریخ انتشار : 1401/12/10

کلید واژه: Williamson-Hall, X-ray Diffraction, Microstrain Broadening, Diffraction Elastic Constant,

چکیده مقاله :

A simple method, to rationalize anisotropic X-ray line widths of deformed FCC metallic samples is presented. The method is based on normalized Diffraction Elastic Constant ratio (DECR) within the framework of Stokes Wilson approximation and Gaussian microstrain distribution. The observed dispersion in classical Williamson-Hall plot was significantly reduced if DECR based correction was applied to the integral breadths. Classical grain interaction models such as the Reuss and Reuss-Voigt average (Neerfeld-Hill) models were used to calculate the elastic constants of deformed polycrystals of Aluminium and Copper. It is observed that if non-uniform microstrains are present in the sample (mostly in the case of dislocated crystals) then the Reuss model is more appropriate than the Reuss-Voigt average model and is observed in the case of filed or ball-milled samples of Cu and Al. The non-linearity in the anisotropy corrected Williamson-Hall is indicative of line widening caused by the dislocation.