Applicability of diffraction elastic constants to rationalize anisotropic broadening of X-ray diffraction line profiles from deformed metals

Ghosh, Debtanu; Munshi, Sujay; Deb, Apurba Kanti; Chatterjee, Partha

doi:10.57647/j.jtap.2023.1701.10

Journal of Theoretical and Applied Physics

Issue 1 Vol. 17 Winter 2023

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Manuscript ID : JTAP-2210-1102 Visit : 61 Page: 0 - 0

10.57647/j.jtap.2023.1701.10

Article Type: Original Research

Applicability of diffraction elastic constants to rationalize anisotropic broadening of X-ray diffraction line profiles from deformed metals

Subject Areas : Journal of Theoretical and Applied Physics

Debtanu Ghosh ¹ (Department of Physics Vivekananda Mahavidyalaya Haripal, Hooghly, West Bengal, India)
Sujay Munshi ² (Department of Physics Raiganj University, Raiganj, Uttar Dinajpur &ndash; West Bengal, India)
Apurba Kanti Deb ³ (Department of Physics Raiganj University, Raiganj, Uttar Dinajpur &ndash; West Bengal, India)
Partha Chatterjee ⁴ (Department of Physics Vivekananda Mahavidyalaya Haripal, Hooghly, West Bengal, India)

Received: 2022-10-09 Accepted : 2022-12-01 Published : 2023-03-01

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Applicability of diffraction elastic constants to rationalize anisotropic broadening of X-ray diffraction line profiles from deformed metals

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