Introduction to Backscattered Electron Diffraction (EBSD)

Subject Areas : journal of New Materials

مهرداد عباسی ¹ , مجید عباسی ²

1 - نویسنده
2 - نویسنده

Received: 2015-12-30 Accepted : 2015-12-30 Published : 2013-03-21

Keywords: Backscattered Electron Diffraction (EBSD, quantitative investigation of microstructure, directional imaging (OIM) directional difference,

Abstract :

In this article, an introduction to the efficient and developing method (EBSD (Electron Backscattered Diffraction) it is possible. Backscattered Electron Diffraction (EBSD) has significant capabilities in the quantitative and qualitative investigation of microstructure. has it. The development of EBSD has recently received wide attention from industries and research centers, so that the main method of investigation The microstructure has changed in many of these centers. This method is used to calculate crystal directions of microstructures (and Nano Microstructures, (phase identification and the degree of distribution of phases are used. The first evidence of EBSD in 1928 in the microscope Transmission electron microscopy (TEM) was observed and until today, great progress has been made in image improvement and data extraction. From It can be mentioned the development of hardware, the preparation of software, the invention of image observation methods and the quantification of microstructure. The principles, history, applications and several practical examples of EBSD are presented in this article.

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