Influence analysis of dielectric pocket on ambipolar behavior and high-frequency performance of dual material gate oxide stack -double gate Nano-Scale TFET
Subject Areas : Journal of Nanoanalysis
Melisa Ebrahimnia
1
(
Department of Electrical Engineering, Rasht Branch, Islamic Azad University, Rasht, Iran.
)
Seyed Ali Sedigh Ziabari
2
(
Department of Electrical Engineering, Rasht Branch, Islamic Azad University, Rasht, Iran
)
Azadeh Kiani-sarkaleh
3
(
Department of Electrical Engineering, Energy and Building Research Center, Rasht Branch, Islamic Azad University, Rasht, Iran.
)
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