Subject Areas : journal of Artificial Intelligence in Electrical Engineering
MOHAMMAD nazaralilou
1
,
behrouz tousi
2
,
Mohammad Farhadi
3
1 -
2 -
3 -
Keywords:
Abstract :
[1] Marko Andjelkovic, Milos Krstic, “Characterization and modeling of Single Event Transient propagation through standard combinational cells,” Microelectronics Reliability,November 2023, volume 150.
[2] Shuo Cai, Binyong He, Weizheng Wang, Peng Liu, Fei Yu, Lairong Yin, Bo Li, “Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults,” Journal of Electronic Testing, 2020, volume 36, pp. 469–483.
[3] Jahanzeb Anwer, Sebastian Meisner, Marco Platzner, “Dynamic Reliability Management for FPGA-Based Systems,” International Journal of Reconfigurable Computing, June 2020, pp, 1 - 19.
[4] H. H. Lee, K. Lilja, M. Bunasser, I. Linscott, and U. Inan, “Single Event Transient on Combinational Logic: An Introduction and their Mitigation,” Journal of Integrated Circuits and Systems, vol. 17, n. 3, 2022.
[5] Yaqing Chi, Zhenyu Wu, Pengcheng Huang, Qian Sun, Bin Liang, Zhenyu Zhao, “Characterization of single-event transients induced by high LET heavy ions in 16 nm bulk FinFET inverter chains,” Microelectronics Reliability, Volume 130, March 2022, 114490.
[6] Marko S. Andjelković, “A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells,” Thesis, Apr 2022.
[7] B. Liu and L. Cai, “Reliability Evolution for Single Event Transient on Digital Circuit,” IEEE Transaction on Reliability, 61(3), 2012, pp. 592 – 601.
[8] Daisuke Kobayashi, “Scaling Trends of Digital Single-Event Effects: A Survey of SEU and SET Parameters and Comparison with Transistor Performance,” IEEE Transactions on Nuclear Science, December 2020, PP (99):1-1.
[9] G. Levitin and L. xing, “Reliability and performance of multistate systems with propagated failures having selective effect,” Reliability Engineering and system safety, vol. 95, 2010, pp.655-661.
[10] Krishnaswamy, S., Viamontes, G.F., Markov, I.L. and Hayes, J.P., "Probabilistic transfer matrices in symbolic reliability analysis of logic circuits," ACM Trans. Design Automation of Electronic Systems, 13, no. 1, pp.8:1-8:35, Jan. 2008.
[11] Ghaith bany hamad, Otmane Ait Mohamed, Yvon Savaria, “ Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits,” Journal of Electronic Testing, October 2017, pp. 33(1).
