Subject Areas : Journal of Optoelectronical Nanostructures

Sayed Mohammad Sadegh Hashemi Nassab ¹ , Mohsen Imanieh ² , Abbas Kamaly ³

1 - Department ofElectrical Engineering, Fasa Branch, Islamic Azad University, Fasa, Iran.
2 - Department ofElectrical Engineering, Fasa Branch, Islamic Azad University, Fasa, Iran.
3 - Department ofElectrical Engineering, Fasa Branch, Islamic Azad University, Fasa, Iran.

Received: 2015-06-12 Accepted : 2015-12-29 Published : 2016-06-01

Keywords:

References:

[1]     M. I. Hoffertet, K. Caldeira,  A. K. Jain,  E. F. Haites, L. D. Danny Harvey, S. D. Potter, M. E. Schlesinger, S. H. Schneider, R. G. Watts, T. M. L. Wigley, D. J. Wuebbles, Energy Implications of Future Stabilization of Atmospheric CO2 Content.Nature, 395 (1998) 881-884. Bp Global, Bp Statistical Review of World Energy June 2007.

(http://www.bp.com/statisticalreview(last accessed August 2007).

[2]     C.Huang, Effects of Ga content on Cu(In,Ga)Se₂ solar cells studied by numerical modeling studied bynumbericmodeling, J. Phys. Chem. Solids, 96 (2002) 330-334.

[3]     I. Repins, S. Glynn, J. Duenow, T. J. Coutts, W. K. Metzger and M. A, Contreras, Required Material Properties for High-Efficiency CIGS Modules, National Renewable Energy Laboratory, 2009, 1-14.

[4]     P. Chelvanathan, M. Hossain, N.Amin, Performance analysis of copper-indium-gallium- deselenide(CIGS) solar cell with various buffer layers by SCAPS, Curr. Appl. Phys, 1 (3)(2000) 323-390.

[5]     J. Lu, W. Liu, A. Y. Kovalgin, Y. Sun, J. Schmitz, S. Member. Integration of solar cells on top of CMOS chip, IEEETrans. Electron. 58 (8) (2011)  2620 - 2627

[6]     A.Luque.and, S. Hegedus,Handbook of Photovoltaic Science and Engineering,Wiley, Usa,2003,1^st.

[7]     J. T. Heath,J. D. Cohen ,W.N.Shafarman,D.X.  Liao, andA.A.Rockett, Effect of Ga content on defect states in CuIn_1−x Ga_x Se₂ photovoltaic devices, Appl. Phys. Lett,  80  (2002 )  4540-4542.

[8]     P.D.Paulson, R. Birkmire,andW.N.Shafarman., Optical Charactrization Of Cu ln_1-x Ga_x Se₂AlloyThinFilms by Spectroscopic Ellipsometry,J.Appl.Phys. 94(2003)  879-888.