Reliability Computation for Single Event Transient on Various Encoder Structures of Flash ADCs
Subject Areas : journal of Artificial Intelligence in Electrical Engineering
MOHAMMAD nazaralilou
1
,
behrouz tousi
2
*
,
Mohammad Farhadi
3
1 - Department of Electrical Engineering, Urmia University, Urmia, Iran
2 - Department of Electrical Engineering, Urmia University, Urmia, Iran
3 - Department of Electrical Engineering, Urmia University, Urmia, Iran
Keywords: Reliability, Single Event Transient, Encoder, Flash ADC. ,
Abstract :
the importance of reliability of digital circuits and the impact of cosmic radiation and single event transient (SET) on circuits, with reducing the technology scaling and operating voltage, is increasing dramatically. In this paper, the reliability of different encoder structures that used in the flash analog to digital converters, were calculated and compared in term of single event transient. The impacts of masking (logic and electrical) and crosstalk effects between interconnects on reliability are considered when evaluating the reliability of SET in this circuits. The results indicate that reliability for SET on Encoder Rom structure is more than other structures. The masking and crosstalk effects will improve the reliability of this circuits by more than 42%.
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