Design of NIR-TERS system based on optimized grating on the AFM probe under radial polarized light for detection of molecular sample

محورهای موضوعی : فصلنامه نانوساختارهای اپتوالکترونیکی

Mohsen Katebi Jahromi ¹ , Rahim Ghayour ² , Zahra Adelpour ³

1 - Department of Electrical Engineering, Shiraz Branch, Islamic Azad University, Shiraz, Iran.
2 - Department of Electrical Engineering, Shiraz Branch, Islamic Azad University, Shiraz, Iran.
3 - Department of Electrical Engineering, Shiraz Branch, Islamic Azad University, Shiraz, Iran.

تاریخ دریافت : 1400/04/27 تاریخ پذیرش : 1400/09/24 تاریخ انتشار : 1400/07/09

کلید واژه: Spectroscopy, AFM, NIR sensor, Plasmon, TERS,

چکیده مقاله :

To the best of our knowledge, it is for the first time that
TERS system in near-infrared (NIR) spectrum is
reporting. The current study proposed a most favorable
atomic force microscopy (AFM) tip based on an
incorporated optimal grating structure close to the tip
apex. The optimized M2 factor and the best spatial
resolution are obtained as 5.9× 109 and 8.5 nm
respectively in the NIR range of radiation light. The
results show that the optimized grating can effectively
increase the amount of intensity of electric field and
improve spatial resolution within the nanoslit between the
AFM tip and substrate. The detection sensitivity of
materials can be done by our proposed AFM-TERS
system. The difference between the maximum
enhancement factors that are correlated to several under
test sample molecules show the selectivity potential of
the proposed AFM-TERS system in material detection
topic.

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