Investigation of the Effect of Post-annealing Temperature on Improving the Structural and Ammonia Gas Sensing Properties Mg-doped ZnO Nano Films
Subject Areas :
S. Goudarzi
1
,
K. Khojier
2
,
S.A.A. Terohid
3
1 - Department of Physics, Hamedan Branch, Islamic Azad University, Hamedan, Iran
2 - Department of Physics, Chalous Branch, Islamic Azad University, Chalous, Iran
3 - Department of Physics, Hamedan Branch, Islamic Azad University, Hamedan, Iran
Received: 2021-10-18
Accepted : 2021-10-18
Published : 2021-09-23
Keywords:
References:
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Mariappan, V. Ponnuswamy, R. Suresh, P. Suresh, V. Chandra-Bose, M. Ragavendar, Journal of Alloys and Compounds, 582, 2014, 387.
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Zolghadr, K. Khojier, S. Kimiagar, Materials Science in Semiconductor Processing, 54, 2016, 6.
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E. Warren, X-ray Diffraction, Addison Wesley Publishing Co., London, 1969.
H. Chung, D.K. Smith, Industrial Applications of X-Ray Diffraction Patterns, (Marcel Dekker Publisher, New York, 1999).
Khojier, H. Savaloni, Z. Ashkabusi, N.Z. Dehnavi, Applied Surface Science, 284, 2013, 489.
Fruhberger, N. Stirling, F.G. Grillo, S. Ma, D. Ruthven, R.J. Lad, Sensors Actuators B, Chemical, 76, 2001, 226.
Luo, Y. Shen, Z. Wu, M. Cao, F. Gu, L. Wang, Materials Science in Semiconductor Processing, 41, 2016, 535.
H. Li, Y.C. Liu, C.L. Shaob, X.T. Zhang, Journal of Colloid and Interface Science, 283, 2005, 513.
R. Patil, L.A. Patil, Sensors Actuators B, 126, 2007, 368.
Khojier, H. Savaloni, S. Zolghadr, Applied Surface Science, 320, 2014, 315.
K. Mani, J. Rayappan, Materials Science and Engineering B, 191, 2015, 41.
S. Ganesh, M. Navaneeethan, V.L. Patil, S. Ponnusamy, C. Muthamizhchelvan, Sensors Actuators B, 255, 2018, 672.
S. Ganesh, E. Durgadevi, M. Navaneethan, V.L. Patil, Journal of Alloys and Compounds, 721, 2017, 182.
R. Patil, L.A. Patil, Sensors Actuators B, 126, 2007, 368.
L. Patil, M.A. Chougule, Measurement, 45, 2012, 243.
S. Grace, J.J. Devadasan, K. Jeyadheepan, IOSR Journal of Applied Physics, 3, 2017, 52.
S. Shinde, S.S. Samanta, M.S. Sonawane, P.B. Ahirrao, R.S. Patil, Journal of Nanotechnology and Advanced Materials, 3, 2015, 99.
G.K. Mani, J.B.B. Rayappan, Applied Surface Science, 311, 2014, 405.
_||_
T. Guntner, M. Righettoni, S.E. Pratsinis, Sensors Actuators B Chemistry, 223, 2016, 266.
Yoo, Y. Park, H. Jung, H.J. Rim, S. Cho, H.S. Lee, W. Lee, Journal of Alloys and Compound, 803, 2019, 135.
Staerz, U. Weimar, N. Barsan, Sensors, 16, 2016, 1815.
Natale, R. Paolesse, E. Martinelli, R. Capuano, Analytica Chimica Acta, 24, 2014, 1.
Righettoni, A. Amann, Materials Today, 18, 2015, 163.
H. Mhlongo, D.E. Motaung, F.R. Cummings, H.C. Swart, S.S. Ray, Scientific Reports, 9, 2019, 9881.
Imawan, F. Solzbacher, H. Steffes, E. Obermeier, Sensors Actuators B Chem, 64, 2000, 193.
Wang, F. Jia, X. Wang, L. Hu, Y. Sun, G. Yin, T. Zhou, Z. Feng, P. Kumar, B. Liu, ACS Omega, 10, 2020, 5209.
Zheng, M. Li, X. Wen, Molecules, 25, 2020, 1899.
K. Mani, J.B.B. Rayappan, Sensors Actuators B Chemistry, 183, 2013, 459.
J. Kulandaisamy, J.R. Reddy, P. Srinivasan, K.J. Babu, G.K. Mani, P. Shankar, J.B.B. Rayappan, Journal of Alloys and Compounds, 688, 2016, 422.
L. Tarwal, A.R. Patil, N.S. Harale, A.V. Rajgure, S.S. Suryavanshi, W.R. Bae, P.S. Patil, J.H. Kim, J.H. Jang, Journal of Alloys and Compounds, 598, 2014, 282.
Mariappan, V. Ponnuswamy, R. Suresh, P. Suresh, V. Chandra-Bose, M. Ragavendar, Journal of Alloys and Compounds, 582, 2014, 387.
K. Mani, J.B.B. Rayappan, Journal of Alloys and Compounds, 582, 2014, 414.
Goudarzi, K. Khojier, AIP Conference Proceedings, 1920, 2018.
Goudarzi, K. Khojier, Journal of Applied Physics A, 124, 2018, 601.
Khojier, H. Savaloni, Journal of Electeric Materials, 44, 2015, 3458.
Zolghadr, K. Khojier, S. Kimiagar, Materials Science in Semiconductor Processing, 54, 2016, 6.
Khojier, H. Savaloni, N. Habashi, M.H. Sadi, Materials Science in Semiconductor Processing, 41, 2016, 177.
E. Warren, X-ray Diffraction, Addison Wesley Publishing Co., London, 1969.
H. Chung, D.K. Smith, Industrial Applications of X-Ray Diffraction Patterns, (Marcel Dekker Publisher, New York, 1999).
Khojier, H. Savaloni, Z. Ashkabusi, N.Z. Dehnavi, Applied Surface Science, 284, 2013, 489.
Fruhberger, N. Stirling, F.G. Grillo, S. Ma, D. Ruthven, R.J. Lad, Sensors Actuators B, Chemical, 76, 2001, 226.
Luo, Y. Shen, Z. Wu, M. Cao, F. Gu, L. Wang, Materials Science in Semiconductor Processing, 41, 2016, 535.
H. Li, Y.C. Liu, C.L. Shaob, X.T. Zhang, Journal of Colloid and Interface Science, 283, 2005, 513.
R. Patil, L.A. Patil, Sensors Actuators B, 126, 2007, 368.
Khojier, H. Savaloni, S. Zolghadr, Applied Surface Science, 320, 2014, 315.
K. Mani, J. Rayappan, Materials Science and Engineering B, 191, 2015, 41.
S. Ganesh, M. Navaneeethan, V.L. Patil, S. Ponnusamy, C. Muthamizhchelvan, Sensors Actuators B, 255, 2018, 672.
S. Ganesh, E. Durgadevi, M. Navaneethan, V.L. Patil, Journal of Alloys and Compounds, 721, 2017, 182.
R. Patil, L.A. Patil, Sensors Actuators B, 126, 2007, 368.
L. Patil, M.A. Chougule, Measurement, 45, 2012, 243.
S. Grace, J.J. Devadasan, K. Jeyadheepan, IOSR Journal of Applied Physics, 3, 2017, 52.
S. Shinde, S.S. Samanta, M.S. Sonawane, P.B. Ahirrao, R.S. Patil, Journal of Nanotechnology and Advanced Materials, 3, 2015, 99.
G.K. Mani, J.B.B. Rayappan, Applied Surface Science, 311, 2014, 405.
