Boussaha, Ahmed , Makhloufi, Rafik, Benbouta, Rachid , Brioua, Mourad. Modeling at the nanometric scale of interfacial defects of a semiconductor heterostructure in the isotropic and anisotropic cases for the study of the influence of stresses.. Journal of Solid Mechanics. 2024;16(1):65-73. doi:https://doi.org/10.60664/jsm.2024.3031774