Investigation of the Effect of Post-annealing Temperature on Improving the Structural and Ammonia Gas Sensing Properties Mg-doped ZnO Nano Films

Subject Areas :

S. Goudarzi ¹ (Department of Physics, Hamedan Branch, Islamic Azad University, Hamedan, Iran)
K. Khojier ² (Department of Physics, Chalous Branch, Islamic Azad University, Chalous, Iran)
S.A.A. Terohid ³ (Department of Physics, Hamedan Branch, Islamic Azad University, Hamedan, Iran)

Received: 2021-10-18 Accepted : 2021-10-18 Published : 2021-09-23

Keywords:

References:

• T. Guntner, M. Righettoni, S.E. Pratsinis, Sensors Actuators B Chemistry, 223, 2016, 266.


• Yoo, Y. Park, H. Jung, H.J. Rim, S. Cho, H.S. Lee, W. Lee, Journal of Alloys and Compound, 803, 2019, 135.


• Staerz, U. Weimar, N. Barsan, Sensors, 16, 2016, 1815.


• Natale, R. Paolesse, E. Martinelli, R. Capuano, Analytica Chimica Acta, 24, 2014, 1.


• Righettoni, A. Amann, Materials Today, 18, 2015, 163.


• H. Mhlongo, D.E. Motaung, F.R. Cummings, H.C. Swart, S.S. Ray, Scientific Reports, 9, 2019, 9881.


• Imawan, F. Solzbacher, H. Steffes, E. Obermeier, Sensors Actuators B Chem, 64, 2000, 193.


• Wang, F. Jia, X. Wang, L. Hu, Y. Sun, G. Yin, T. Zhou, Z. Feng, P. Kumar, B. Liu, ACS Omega, 10, 2020, 5209.


• Zheng, M. Li, X. Wen, Molecules, 25, 2020, 1899.


• K. Mani, J.B.B. Rayappan, Sensors Actuators B Chemistry, 183, 2013, 459.


• J. Kulandaisamy, J.R. Reddy, P. Srinivasan, K.J. Babu, G.K. Mani, P. Shankar, J.B.B. Rayappan, Journal of Alloys and Compounds, 688, 2016, 422.


• L. Tarwal, A.R. Patil, N.S. Harale, A.V. Rajgure, S.S. Suryavanshi, W.R. Bae, P.S. Patil, J.H. Kim, J.H. Jang, Journal of Alloys and Compounds, 598, 2014, 282.


• Mariappan, V. Ponnuswamy, R. Suresh, P. Suresh, V. Chandra-Bose, M. Ragavendar, Journal of Alloys and Compounds, 582, 2014, 387.


• K. Mani, J.B.B. Rayappan, Journal of Alloys and Compounds, 582, 2014, 414.


• Goudarzi, K. Khojier, AIP Conference Proceedings, 1920, 2018.


• Goudarzi, K. Khojier, Journal of Applied Physics A, 124, 2018, 601.


• Khojier, H. Savaloni, Journal of Electeric Materials, 44, 2015, 3458.


• Zolghadr, K. Khojier, S. Kimiagar, Materials Science in Semiconductor Processing, 54, 2016, 6.


• Khojier, H. Savaloni, N. Habashi, M.H. Sadi, Materials Science in Semiconductor Processing, 41, 2016, 177.


• E. Warren, X-ray Diffraction, Addison Wesley Publishing Co., London, 1969.


• H. Chung, D.K. Smith, Industrial Applications of X-Ray Diffraction Patterns, (Marcel Dekker Publisher, New York, 1999).


• Khojier, H. Savaloni, Z. Ashkabusi, N.Z. Dehnavi, Applied Surface Science, 284, 2013, 489.


• Fruhberger, N. Stirling, F.G. Grillo, S. Ma, D. Ruthven, R.J. Lad, Sensors Actuators B, Chemical, 76, 2001, 226.


• Luo, Y. Shen, Z. Wu, M. Cao, F. Gu, L. Wang, Materials Science in Semiconductor Processing, 41, 2016, 535.


• H. Li, Y.C. Liu, C.L. Shaob, X.T. Zhang, Journal of Colloid and Interface Science, 283, 2005, 513.


• R. Patil, L.A. Patil, Sensors Actuators B, 126, 2007, 368.


• Khojier, H. Savaloni, S. Zolghadr, Applied Surface Science, 320, 2014, 315.


• K. Mani, J. Rayappan, Materials Science and Engineering B, 191, 2015, 41.


• S. Ganesh, M. Navaneeethan, V.L. Patil, S. Ponnusamy, C. Muthamizhchelvan, Sensors Actuators B, 255, 2018, 672.


• S. Ganesh, E. Durgadevi, M. Navaneethan, V.L. Patil, Journal of Alloys and Compounds, 721, 2017, 182.


• R. Patil, L.A. Patil, Sensors Actuators B, 126, 2007, 368.


• L. Patil, M.A. Chougule, Measurement, 45, 2012, 243.


• S. Grace, J.J. Devadasan, K. Jeyadheepan, IOSR Journal of Applied Physics, 3, 2017, 52.


• S. Shinde, S.S. Samanta, M.S. Sonawane, P.B. Ahirrao, R.S. Patil, Journal of Nanotechnology and Advanced Materials, 3, 2015, 99.


• G.K. Mani, J.B.B. Rayappan, Applied Surface Science, 311, 2014, 405.