A comparative investigation on growth, nanostructure and electrical properties of copper oxide thin films as a function of annealing conditions
Subject Areas : Journal of Theoretical and Applied Physics
K.
Khojier
1
(Department of Physics, Chalous Branch, Islamic Azad University)
H.
Savaloni
2
(Department of Physics, University of Tehran)
Z.
Sadeghi
3
(Department of Physics, Faculty of Science, Central Tehran Branch, Islamic Azad University)
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