A comparative investigation on growth, nanostructure and electrical properties of copper oxide thin films as a function of annealing conditions

Subject Areas : Journal of Theoretical and Applied Physics

K. Khojier ¹ , H. Savaloni ² , Z. Sadeghi ³

1 - Department of Physics, Chalous Branch, Islamic Azad University
2 - Department of Physics, University of Tehran
3 - Department of Physics, Faculty of Science, Central Tehran Branch, Islamic Azad University

Accepted : 2014-04-01 Published : 2014-04-01

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