TY  - JOUR
AU  - Hojabri, Alireza
TI  - Structural and optical characterization of ZrO2 thin films grown on silicon and quartz substrates
JO  - Journal of Theoretical and Applied Physics
VL  - 0
IS  - 3
SP  - 219
EP  - 224
PY  - 2016
DO  - 10.1007/s40094-016-0218-8
ER  -