Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator
الموضوعات : Journal of Theoretical and Applied PhysicsYufang Zhang 1 , Zhenqing Wang 2
1 - College of Physics and Electronic Engineering, Northwest Normal University
2 - College of Physics and Electronic Engineering, Northwest Normal University
الکلمات المفتاحية: Dielectric loss tangent, Superconducting plate resonato, Cryogenic temperature,
ملخص المقالة :
AbstractWe demonstrate that the superconducting film resonator can be used to accurately and quantitatively measure the microwave dielectric loss tangent of a variety of materials. Compared to traditional dielectric resonator loaded metal cavity method, it has advantage of small sample size (~2–3 orders of magnitude smaller than the old method), and much higher sensitivity to measure small loss tangent values as small as 10−5 at around 7 GHz band at cryogenic temperatures. This method can be utilized widely in study of mechanism of microwave loss at cryogenic temperature range, which is extremely important in superconducting microwave application areas, such as novel super quantum computers.
