A Thin Layer Imaging with the Total Internal Reflection Fluorescence Microscopy
الموضوعات : فصلنامه نانوساختارهای اپتوالکترونیکی
Neda Roostaie
1
(Department of physics, Alzahra University, Tehran, Iran)
Elham Sheykhi
2
(Department of physics, Alzahra University, Tehran, Iran)
Fariba Japelaghi
3
(Department of physics, Alzahra University, Tehran, Iran)
Mohammad Amin Bassam
4
(Department of physics, Malek-Ashtar University of Technology, Tehran, Iran)
Sharareh Tavaddod
5
(Department of physics, University of Edinburgh, Scotland)
Batool Sajad
6
(Department of physics, Alzahra University, Tehran, Iran)
الکلمات المفتاحية: Fluorescence, Evanescent wave, microscopy, total internal reflection,
ملخص المقالة :
Total internal reflection fluorescence microscopy (TIRFM) is an optical technique that allows imaging of a thin layer of the sample with a thickness of about 100-200 nm. It is used in science of cell biology to study cellular processes, especially near the membranes of living cells. This method is based on the total internal reflection phenomenon, where the evanescent wave is generated in the less dense medium. In fact, the evanescent wave is used to illuminate the sample. Consequently, the possibility of observing a superficial (instead of bulk) part of fluorophore labeled sample is opened up. In this work, a total internal reflection fluorescence microscope based on the light guide has been designed and assembled by means of the inverted microscope to image a thin layer from the surface of the sample. Operated experimental arrangement has been employed for the total internal reflection fluorescence imaging of cadmium selenide (CdSe) quantum dots.
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