%0 Journal Article
%A Malik, Hitendra K., Juneja, Sucheta, Kumar, Sushil
%T Employing constant photocurrent method for the study of defects in silicon thin films
%J Journal of Theoretical and Applied Physics
%V 0
%N 2
%P 107-113
%D 2019
%R 10.1007/s40094-019-0325-4
%U https://sanad.iau.ir/fa/Article/788693