TY  - JOUR
AU  - Khojier, K.
AU  - Savaloni, H.
AU  - Sadeghi, Z.
TI  - A comparative investigation on growth, nanostructure and electrical properties of copper oxide thin films as a function of annealing conditions
JO  - Journal of Theoretical and Applied Physics
VL  - 0
IS  - 1
SP  - 0
EP  - 0
PY  - 2014
DO  - 10.1007/s40094-014-0116-x
ER  -